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7. KISTI 연구성과
특허
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This item is licensed Korea Open Government License
Title
다중 특허지표를 이용한 기술 수명 주기 분석 장치
Alternative Title
Apparatus for technology life analysis using multiple patent indicators
Author(s)
권오진
;
이창용
;
김주람
;
노경란
Publication Year
2016-06-03
DOI
10.8080/1016291780000
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7. KISTI 연구성과
>
특허
Type
Patent
URI
https://repository.kisti.re.kr/handle/10580/13342
Fulltext
http://www.ndsl.kr/ndsl/search/detail/patent/patentSearchResultDetail.do?cn=KOR1020150183080
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