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공공누리This item is licensed Korea Open Government License

Title
다중 특허지표를 이용한 기술 수명 주기 분석 장치
Alternative Title
Apparatus for technology life analysis using multiple patent indicators
Author(s)
권오진이창용김주람노경란
Publication Year
2016-06-03
DOI
10.8080/1016291780000
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Appears in Collections:
7. KISTI 연구성과 > 특허
Type
Patent
URI
https://repository.kisti.re.kr/handle/10580/13342
Fulltext
 http://www.ndsl.kr/ndsl/search/detail/patent/patentSearchResultDetail.do?cn=KOR1020150183080
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