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2016-02-01Step-Down Spatial Randomness Test for Detecting Abnormalities in DRAM Wafers with Multiple Spatial Maps김병훈동승훈장인갑정명기정영선750
2015-11-05System Informatics: From Methodology to ApplicationsKang Zhao김병훈670
2017-12-31나노 인포메틱스 기반 구축을 위한 구글 트렌드와 데이터 마이닝 기법을 활용한 나노기술 트렌드 분석신민수배성훈박민규751
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