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공공누리This item is licensed Korea Open Government License

dc.contributor.author
황정연
dc.contributor.author
이문규
dc.contributor.author
송보연
dc.contributor.author
조현숙
dc.contributor.author
진승헌
dc.contributor.author
최대선
dc.date.accessioned
2019-08-28T07:42:12Z
dc.date.available
2019-08-28T07:42:12Z
dc.date.issued
2017-02-01
dc.identifier.issn
0304-3975
dc.identifier.uri
https://repository.kisti.re.kr/handle/10580/14719
dc.identifier.uri
http://www.ndsl.kr/ndsl/search/detail/article/articleSearchResultDetail.do?cn=NART77131083
dc.description.abstract
The Small Exponent Test (SET) for exponentiation is an essential batch-verification technique that is widely applied. In this paper, we propose a simplified SET that can securely batch-verify n   instances with only n−1n−1 randomizing exponents. We show that the structure of the proposed batch test is compact in the sense that it works with a minimal number of randomizing exponents for the SET. Thus, our test offers various advantages. Overall, compared to the original SET, the proposed simplified SET is more efficient for any sized batch instance. In particular, unlike the SET, our proposal performs well even when the size of a batch instance is small, e.g., n=1,2,3n=1,2,3, and 4. This feature can be also used to significantly reduce pairing computations in a signature scheme where several pairing equations are verified. In addition, our test can be combined easily and generically with existing batch techniques such as the use of sparse exponents, the bucket test for large batch sizes, or an automated tool to generate a batch algorithm. Finally, with our simplified test, an efficient identification algorithm can be constructed to discover incorrect instances in a batch
dc.language
eng
dc.relation.ispartofseries
Theoretical Computer Science
dc.title
Simplified small exponent test for batch verification
dc.citation.endPage
58
dc.citation.startPage
48
dc.citation.volume
662
dc.subject.keyword
Batch verification
dc.subject.keyword
Exponentiation
dc.subject.keyword
Small exponent test
dc.subject.keyword
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