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This item is licensed Korea Open Government License
- Title
- Theoretical Study of Bias-Dependent Scanning Tunneling Microscopy Images
- Author(s)
- 이홍석
- Publication Year
- 2008-04-04
- Abstract
-
P-rich InP(111)A-(2x2) 반도체 표면에 대한 전자구조 계산 방법을 이용하여, 전자기적
특셩을 연구한 논문이다.
- Journal Title
- Journal of the Korean Physical Society
- Citation Volume
- 52
- ISSN
- 0374-4884
- Files in This Item:
- There are no files associated with this item.
- Appears in Collections:
- 7. KISTI 연구성과 > 학술지 발표논문
