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This item is licensed Korea Open Government License
- dc.contributor.author
- 최성배
- dc.contributor.author
- 홍성화
- dc.contributor.author
- 강현무
- dc.contributor.author
- 권영일
- dc.contributor.author
- 박종규
- dc.date.accessioned
- 2018-11-29T07:50:10Z
- dc.date.available
- 2018-11-29T07:50:10Z
- dc.date.issued
- 2012-11-02
- dc.identifier.uri
- https://repository.kisti.re.kr/handle/10580/13100
- dc.title
- 기술정보 평가 시스템 및 평가 방법
- dc.title.alternative
- QUALITY MEASUREMENT SYSTEM AND METHOD FOR SCIENTIFIC TECHNOLOGY INFORMATION
- dc.type
- Patent
- dc.identifier.doi
- 10.8080/1020100081583
- dc.identifier.doi
- 10.8080/1011995260000
- dc.date.application
- 2010-08-23
- dc.date.registration
- 2012-11-02
- dc.identifier.localId
- KOR1020100081583
- dc.identifier.patentApplicationNumber
- 10-2010-0081583
- dc.identifier.patentRegistrationNumber
- 10-1199526-0000
- dc.identifier.url
- http://www.ndsl.kr/ndsl/search/detail/patent/patentSearchResultDetail.do?cn=KOR1020100081583
- Appears in Collections:
- 7. KISTI 연구성과 > 특허
- Files in This Item:
- There are no files associated with this item.
