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공공누리This item is licensed Korea Open Government License

dc.contributor.author
최동훈
dc.contributor.author
황순욱
dc.contributor.author
남덕윤
dc.contributor.author
김남규
dc.contributor.author
이준학
dc.contributor.author
조금원
dc.contributor.author
변옥환
dc.contributor.author
염헌영
dc.contributor.author
한혁
dc.contributor.author
권희석
dc.contributor.author
정원구
dc.contributor.author
정종만
dc.date.accessioned
2018-11-29T07:50:02Z
dc.date.available
2018-11-29T07:50:02Z
dc.date.issued
2010-12-20
dc.identifier.uri
https://repository.kisti.re.kr/handle/10580/13043
dc.title
전자 현미경의 원격 제어 시스템 및 제어방법
dc.title.alternative
System and method for controlling electron microscope
dc.type
Patent
dc.identifier.doi
10.8080/1020080096416
dc.identifier.doi
10.8080/1010039970000
dc.date.application
2008-10-01
dc.date.registration
2010-12-20
dc.identifier.localId
KOR1020080096416
dc.identifier.patentApplicationNumber
10-2008-0096416
dc.identifier.patentRegistrationNumber
10-1003997-0000
dc.identifier.url
http://www.ndsl.kr/ndsl/search/detail/patent/patentSearchResultDetail.do?cn=KOR1020080096416
Appears in Collections:
7. KISTI 연구성과 > 특허
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